1800 N.
Glenville Drive, Suite 136
Richardson, Texas 75081
Tel: (972) 542-3111
Fax: (972) 542-2131
e-mail: info@testronics.com
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1800 N.
Glenville Drive, Suite 136 |
Advanced test capability and expanded fault coverage without the expense of re-fixturing
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Sales / Service Locations
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Many times when product advancements do not continue to move forward, a good test system can quickly become obsolete. This lack of product development forces you to use a test system that suffers from poor fault coverage, absence of new capabilities, and limited technical support. Even simple things such as networking and datalogging are extremely difficult due to obsolete operating systems and slow PCs. To further compound the problem, the investment over the years in fixtures makes the purchase of a new test system a very expensive alternative. Until now, to upgrade your test capability, you had to buy a new test system and replace all of the fixtures. In today’s tight economic environment, this is normally not an option. The reality is that you have been forced to compromise your test coverage as the capabilities of your test system have not kept up with the test requirements of today’s advanced products. Testronics, one of the global leaders in advanced In-Circuit Test Systems has developed a cost effective upgrade for the Tescon MDA / ICT test systems. The upgrade from Testronics replaces only the Tescon electronics and PC. The Tescon press and fixtures continue to be used. Also included in the upgrade is a software utility that converts the existing Tescon test programs into the more advanced Testronics format. By replacing only the Tescon electronics and PC, |
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Primary advantages of the Testronics Upgrade:
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Additional advantages of the Testronics Upgrade:
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Testronics
Model 406 Frequently Asked Questions ¨ IC test: Please explain how you test IC’s. Will you check all pins of the IC or only a few unique pins? What about BGA’s? Analog
IC Verification - Each lead on every IC is automatically characterized
with respect to itself and all other pins within that same IC. Two
measurements are made on each IC pin providing a unique signature thereby
enabling detection of SMD lifted pad faults as well as missing, reversed,
or wrong IC faults. The two measurements that are made are: Vf
(forward voltage drop) at 1mA and Vf at 5mA. These are compared
to the stored Vf and delta Vf of each pin. These
levels are fully programmable. This IC characterization method is the
fastest, easiest to use and least costly of all vectorless techniques.
Furthermore, the Testronics IC Verification is the only method suitable
for BGA’s short of Boundary Scan. The only circumstance where this
technique will not work is only on pins that are bussed together, (such as
in a SIMM ram module). ¨ How do you test bused IC pins? What type of defects can you detect in this case? The
most efficient way to test bussed pins on an IC’s is with Agilent’s (HP’s)
Test Jet. Keep in mind that the Testronics Analog IC verification
technique will find open solder joints on all IC’s and BGA’s that are
not bussed. Therefore, Test Jet is only needed on a very few of the IC’s
pins. Please note that TestJet is not all that effective on BGA’s. To
test BGA connectivity the Testronics IC Verification should be used. ¨ Can the test program support multiple variants [board options] or panelization of one board? Yes, by inserting branching and conditional variables into the program, the operator can be prompted as to which variant he wants to test and that portion of the program will be run. Panelized boards are programmed by debugging the first board and then running a macro to automatically expand the program for the rest of the boards in the panel. Testronics Operating System (TOS) provides automated test program generation with intuitive software tools and input screens for programming ease. ¨ Does the 406 provide for expansion into functional testing? Yes,
the 406 Analog In-Circuit test system is designed with a scaleable, open
architecture and modular plug and play system cards. The system provides
the user with almost unlimited flexibility by using a VME style bus
designed specifically for in-circuit test. A Testronics instrument card
combined with IEEE instruments can create functional level tests. The IEEE
functional signals can be sent bi-directionally to any point on the test
system matrix. For example, one of our customers runs the standard MDA
test, powers up the board with a programmable HP PS, digitally tests a
display driver with National Instruments computer digital I/O cards, and
also runs an interactive light and button test. This has allowed them to
combine their functional test with their ICT test, reducing equipment
costs, labor costs, and handling time.
¨ Does the software provide the ability to give control to another executable program and return to the Testronics test program? Yes,
TOS provides an action or function called “exec” which when inserted
into your test program, relinquishes program control to an executable file
developed from a language of your choice and then returns to test program. |
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Testronics Model 406A Analog ICT
Copyright © 2001 Testronics. All rights reserved. Information subject to change without notice.
Revised: 08/03/04