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406 Frequently Asked Questions

 

¨ IC test: Please explain how you test IC’s. Will you check all pins of the IC or only a few unique pins?

Analog IC Verification - Each lead on every IC is automatically characterized with respect to itself and all other points on the board. Two measurements are made on each IC protection diode providing a unique signature for each IC enabling detection of SMD lifted pad faults as well as missing, reversed, or wrong IC faults. The two measurements that are made are: Vf (forward voltage drop)  at 1mA and Vf at 5mA. These are compared to the compliance Vf and delta Vf. These levels are fully programmable.

¨ How do you handle bused IC’s? What type of defects can you detect in this case?

The most efficient way to test bussed IC’s is with Agilent’s (HP’s) Test Jet. This vectorless test method provides an efficient way to isolate the most common surface mount technology process faults which are open solder joints. Keep in mind that the Testronics Analog IC verification technique will find open solder joints on all IC’s that are not bussed. Therefore, Test Jet is only needed on a portion of the IC’s. A probe plate is positioned directly over the IC to be tested. The capacitance is measured between the plate and each lead of the IC. If the lead of the IC is not soldered to the board, the capacitance value will be an order of magnitude smaller than a properly soldered joint.

¨ What is your experience with different IC manufacturers? Will it effect the test results?

Our 19 years of experience in the test industry has lead us to the development  of an IC test method which provides consistent  test results regardless of the manufacturer of the component. The protection diodes found on virtually every IC produced, do have varying parameters from IC to IC but not normally within the same IC. Typically the Vf or “turn on voltage” will vary between .60 V and .90 V and the delta Vf will vary between 200mV and 300mV. Our software is set up so a diode action with default values is inserted automatically into the test program for each IC. Any of these parameters can be adjusted. The following is an example of the automatically generated program code and a graphical representation of our measurement technique.

 

The * symbol denotes the beginning of the data group, the ! mark denotes the end of the data group.

                                   

                *diodes                                     ;This data group is automatically built during
anode1_cathode1                    ;diode learn in the build menu.
anode2_cathode2                    ;This data group is specific to the quantity and
              .                                       ;location of protection diodes on an IC.
              
.     
              
.  
anodeN_cathodeN                                             
!                                             

 

The action ndiode tests a group of diodes.

                                   

                #ndiode
Vmax= .9V                                ;all argument values are fully programmable
Vmin= .5V
Is=        1mA
dV=      .2V
dI=        4mA
Time=   1ms
!


¨ Do you need a known good board (“golden board”) in order to write the test program?

No, certainly a “golden board” is the ideal situation, however the real world is rarely ideal. The industry preference for developing a test program which will find all board faults without reporting false failures is to use a group of boards along with the schematics to verify component and circuit measurement variances. One board can be used to automatically generate the base test program, learn the nets for opens and shorts, and learn the IC protection diodes. Then several other boards can be used to fine tune the test program.

¨ What support arrangements do you typically provide?

In addition to our unlimited telephone support and one year warranty, we provide our customers with the option to communicate through the e-mail which allows for efficient debugging of test program files. The test system is warranted for a period of 1 year from the date of shipment. During this period there is no charge for parts or labor on items returned to Testronics for repair. There is also no charge for replacement items sent to the customer. If you have a high volume production facility, we recommend purchase of a spares kit for use in the rare event that a hardware failure occurs. Service and support are handled out of our home office in McKinney, Texas. Next Day Warranty replacement is are accomplished via Federal Express. Typical mean time to repair the system is less than 30 minutes. Full training is offered as well as programming services.

¨ Do you provide telephone support?

Yes, Testronics offers unlimited free of charge telephone support.

¨ Can you provide a ‘turnkey’ fixturing solution?

Yes, Testronics offers comprehensive software services for automatic test solutions. These include test programming and fixturing services. You receive the expertise, resourcefulness, reliability, and ready support of an entire engineering department without the added personnel cost.

¨ What is the max node count a Testronics test system can handle?

This is strictly receiver dependent. Testronics has developed an open architecture electronic design. We build test systems in excess of 20,000 points for backplane applications. However, the most popular interface used is the GenRad 2270 style receiver, which gives the test system a maximum of 1600 points. This receiver is standard in our 406A and 406C. We also support the Teradyne style 1800 receiver and the GR228X style receivers.

¨ What types of fixtures do Testronics test systems use?

We use industry standard style fixture kits that mate to the receivers listed above. These kits can be bought from many different vendors globally. We can also use paddle card, mechanical push down, pneumatic press, or custom designed fixtures. The type of fixture used is based more on the customer’s UUT than the test system type. As long as the test system is fitted with an industry standard receiver, just about any type of interface to the UUT can be achieved.
 

¨ Is the Controller PC based?

Yes, Testronics has intentionally taken advantage of the standardization of PC’s using MS Windows OS. The system utilizes the PC’s parallel port for communication between the test system and the PC. This allows the customer to easily network the test system, swap out the PC with a minimum of down time, shorten the learning curve for the operators, and many more advantages.

¨ Can the test program support multiple variants or panelization of one board?

Yes, by inserting branching and conditional variables into the program, the operator can be prompted as to which variant he wants to test and that portion of the program will be run. Panelized boards are programmed by debugging the first board and then running a macro to automatically expand the program for the rest of the boards in the panel. Testronics Operating System (TOS) provides automated test program generation with intuitive software tools and input screens for programming ease.

 

¨ What component tests can it do?

The fault coverage consists of shorts, opens, resistors, capacitors, inductors, diodes (LEDs and Zeners), transistors, IC verification, complex impedance, transformers, solder bridges, missing , reversed, incorrect and/or defective components.

Inductance and capacitance are measured as complex impedance with the use of a multiple frequency AC stimulus measurement unit. The frequencies available are 15.9 Hz, 159 Hz, and 15.9 kHz. 

We can test for transformer polarity, however, the range of test is a function of impedance value. TOS provides a transistor action which tests FETs as an analog switch. Maximum coverage can be achieved by using the diode test in addition to the transistor test.

¨ Does your system provide for expansion into functional testing?

Yes, the 406 Analog In-Circuit test system is designed with a scaleable, open architecture and modular plug and play system cards. The system provides the user with almost unlimited flexibility by using a VME style bus designed specifically for in-circuit test. A Testronics instrument card combined with IEEE instruments can create functional level tests. The IEEE functional signals can be sent bi-directionally to any point on the test system matrix. For example, one of our customers runs the standard MDA test, powers up the board with a programmable HP PS, digitally tests a display driver with National Instruments computer digital I/O cards, and also runs an interactive light and button test. This has allowed them to combine their functional test with their ICT test, reducing equipment costs, labor costs, and handling time. 

¨ Does it support powered tests?

Yes, the 406 can be configured with either the 10V solid state switch cards for MDA testing or with the 50V relay switch cards for power up testing. Usually the customer chooses his own power supplies and we integrate them for him. These can be controlled through IEEE if programmable or with or power up relay boards if fixed.

¨ Does the software provide the ability to give control to another executable program and return to the Testronics test program?

Yes, TOS provides an action or function called “exec” which when inserted into your test program, relinquishes program control to an executable file developed from a language of your choice and then returns to test program.

 

Copyright © 2001 Testronics. All rights reserved. Information subject to change without notice.

Revised: 12/29/03